In this paper, a CMOS data recovery PLL for DVD-ROM is described. Some techniques have been introduced to alleviate the specifications required to analog circuits. A new phase detector alleviates the timing specification of a delay line and a pulse generator. A new frequency detector increases the capture range up to 8% of the center frequency. We have achieved to realize the data recovery PLL that operates at DVD-ROMx14 speed.

This paper describes techniques for widening lock and pull-in ranges and suppressing jitter in clock and data recovery ICs. It is shown theoretically that using a duplicated loop control (DLC)-phase-locked loop (PLL) technique enables wider lock and pull-in ranges in clock and data recovery (CDR) without increasing the cut-off frequency of the jitter transfer function. A 2.5-Gb/s DLC-CDR IC fabricated with a 0.5-µm Si bipolar process provides 2.5 times the lock range and 1.5 times the pull-in range of a conventional CDR IC, and the jitter characteristics of the fabricated CDR IC meet all three STM-16 jitter specifications in ITU-T recommendation G.958.

This paper presents the implementation of a 3 V low power multi-rate of 156, 622, and 1244 Mbps clock and data recovery circuit (CDR) for optical communications tranceiver using new parallel clock recovery architecture based on dual charge-pump PLL. Designed circuit recovers eight-phase clock signals which are one-eighth frequency of the input signal. While the typical system uses the method that compares the input data with recovered clock, the proposed circuit compares a 1/2-bit delayed input data with the serial data generated by the recovered eight-phase clock signals. The advantage of the circuit is that the implementation is easy, since each sub blocks have one-eighth frequency of the input data signal. Morevover, since the circuit works at one-eighth frequency of the input data, it dissipates less power than conventional CMOS recovery circuit. Simulation results show that this recovery circuit can work with power dissipation of less than 40 mW with a single 3 V supply. All the simulations are based on HYUNDAI 0.65 µm N-Well CMOS double-poly double-metal technology.

This paper describes an oversampling data recovery circuit composed of an analog delay locked loop and a digital decision logic. The novel oversampling technique is based on the delay locked loop circuit locked to multiple clock periods rather than a single clock period, which generates the timing resolution less than the gate delay of the delay chain. The digital logic for data recovery was implemented with the assumption that there is no frequency deviation that hurts the center of acquired data. The chip has been fabricated using 0.6 µm CMOS technology. The chip has been tested at 1.0 Gb/s NRZ input data with 125 MHz clock and recovers the serial input data into eight 125 Mb/s output stream.

In this paper an analysis on the oversampling data recovery circuit is presented. The input waveform is assumed to be non-return-zero (NRZ) binary signals. A finite Markov chain model is used to evaluate the steady-state phase jitter performance. Theoretical analysis enables us to predict the input signal-to-noise ratio (SNR) versus bit error rate (BER) of the oversampling data recovery circuit for various oversampling ratios. The more number of samples per single bit results in the better performance on BER at the same input SNR. To achieve 10-11 BER, 8 times oversampling has about 2 dB input signal penalty compared to 16 times oversampling. In an architectural choice of the oversampling data recovery circuit, the recovered clock can be updated in each data bit or in every multiple bits depending on the input data rate and input noise. Two different clock update schemes were analyzed and compared. The scheme updating clock in every data bit has about 1.5 dB penalty against the multiple bits (4 bits) clock updating scheme with 16 times oversampling in white noise dominant input data. The results were applied to the fabricated circuits to validate the analysis.